A NAND gate (negative-AND gate) is a digital electronic circuit which produces an output that is false only if all its inputs are true; in other words, the output of a NAND gate is the complement to the output of an AND gate for the same inputs. A two-input NAND gate is a NAND gate with two inputs. The following figure shows the usual symbol of a two-input NAND gate and its truth table, using $1$ for true and $0$ for false.

In this problem we have a binary tree representing a circuit composed only by two-input NAND gates. In the tree, each internal node represents a NAND gate, which uses as inputs the values produced by its two children. Each leaf in the tree represents an external input to the circuit, and is a value in $\{0, 1\}$. The value produced by the circuit is the value produced by the gate at the root of the tree. The following picture shows a circuit with nine nodes, of which four are NAND gates and five are external inputs.

Each gate in the circuit may be stuck, meaning that it either only produce $0$ or only produce $1$, regardless of the gate’s inputs. A test pattern is an assignment of values to the external inputs so that the value produced by the circuit is incorrect, due to the stuck gates.

Given the description of a circuit, you must write a program to determine the number of different test patterns for that circuit.

The first line contains an integer $N$ $(1 \leq N \leq 10^5)$ representing the number of gates in the circuit, which has the shape of a binary tree. Gates are identified by distinct integers from $1$ to $N$, gate $1$ being the root of the tree. For $i = 1, 2, ..., N$, the $i$-th of the next $N$ lines describes gate $i$ with three integers $X$, $Y$ and $F$ ($0 \leq X, Y \leq N$ and $−1 \leq F \leq 1$). The values $X$ and $Y$ indicate the two inputs to the gate. If $X = 0$ the first input is from an external input, otherwise the input is the output produced by gate $X$. Analogously, if $Y = 0$ the second input is from an external input, otherwise the input is the output produced by gate $Y$. The value $F$ represents the state of the gate: $−1$ means the gate is well-behaved, $0$ means the gate is stuck at $0$, and $1$ means the gate is stuck at $1$.

Output a single line with an integer indicating the number of different test patterns for the given circuit. Because this number can be very large, output the remainder of dividing it by $10^9 + 7$.

Input

4
2 3 1
0 0 -1
4 0 0
0 0 -1

Output

15

Input

2
2 0 1
0 0 -1

Output

3

Input

6
5 4 -1
0 0 -1
0 0 0
6 3 -1
0 2 1
0 0 -1

Output

93

Input

7
2 3 -1
4 5 -1
6 7 -1
0 0 1
0 0 -1
0 0 -1
0 0 -1

Output

21